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X-ray Diffractometer

Name of the Equipment : SmartLab automated multipurpose X-ray Diffractometer

Make : Rigaku

Model : Smartlab

Working Principle:

X-ray diffraction analysis (XRD) is a technique used to determine the crystallographic structure of a material. X-ray diffraction is based on constructive interference of monochromatic X-rays and a crystalline sample. These X-rays are generated by a cathode ray tube, filtered to produce monochromatic radiation, collimated to concentrate, and directed toward the sample.

X-ray diffraction is based on Bragg's law. 2dSinθ=nλ


Technical specifications:

Source of X-ray

Cu Kα1 - 1.542 Å & Cu Kα2 - 1.544 Å (Wave length)


Hybrid Pixel 2-Dimensional Detector (Hypix-3000)

Sample Stage

Fixed, With X-ray source & detector rotation

Sample Holder

Glass sample holder, Aluminium Sample holder, Low background Sample holder, Transmission SAXS sample holder, Capillary holder.

Working condition

Maximum rated load- 9KW,
Rated tube voltage - 20KV to 45 KV
Rated tube current - 10mA to 200mA

Measurement range

0 - 1550


  • Room temperature XRD
  • Low temperature XRD (Up to 4K)
  • High Temperature XRD (Up to 15000C)
  • Reflectivity (XRR)
  • Rocking Curve
  • Transmission SAXS
  • Pole Figure/Texture
  • RSM