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Peltier effect on E-SEM (We can cool between 0ºC to 10ºC, specimen of very diverse in nature can be imaged)
Fig: Environmental Scanning Electron Microscope (ESSM) unit
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Source of electron
W-Filament
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200 V-30 KV
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@30KV@High vacuum conditions
2.4 nm
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3.0 nm
@30KV@E-Sem conditions
5.4 nm
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100 μA
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Everhart-thornley detector for secondary electrons in high vacuum.
GSED for pressures up to 40mbar in ESEM mode operation.
Large field secondary electron detector for low vacuum operation.
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